2014 Semester I

Research activity	Institution
Radiation hardness characterisation of the CLARO‐CMOS read‐out chip for the Upgrade of the LHCb RICH detectors at CERN.	University of Ferrara and INFN Section of Ferrara.
Study of the effect of high fluence irradiation on the swelling and microstructural behavior of anti‐ corrosion coatings for high temperature operation of steels in heavy liquid metals.	ENEA Technical Unit for Fission Technologies, Rome.
Single Event Effects in Non‐volatile Memories.	DEI, University of Padua and INFN Section of Padua.
Single Event Effects in Power MOSFETs.	DIEI, University of Cassino.
Single Event Upsets in the ToPix4 ASIC for the pixel detector readout of the PANDA experiment.	INFN Section of Torino.

2013 Semester II

Research activity	Institution
Single Event Upset tests of the GBLD laser driver for the GBT project .	INFN Section of Turin.
Study of Single Event Effect (SEE) on pixel readout integrated circuits for extreme rate and radiation.	Department of Physics and Astronomy, University of Padova and INFN Section of Padova.
Single Event Effects in Non-volatile Memories.	DEI, University of Padua and INFN Section of Padua.
Single Event Effects in Power MOSFETs.	DIEI, University of Cassino.
Study of performance degradation of Silicon Photomultipliers (SiPMs) induced by proton irradiation.	INFN Section of Trieste.